Chapter 47: Electromigration in a Solder Ball

This example problem is a transient electromigration analysis of a solder ball. The finite element solution calculates the deviation in atomic concentration from an initial unit value due to the combined effect of diffusion, electromigration, stress migration, and thermomigration.

The following features and capabilities are highlighted:

You can also perform this example analysis entirely in the Ansys Mechanical Application. For more information, see Electromigration in a Solder Ball in the Mechanical Technology Showcase: Example Problems.