VM220

VM220
Electromigration Diffusion Problem with Perfectly Blocking Diffusion Barrier

Overview

Reference: Clement, J.J., Lloyd, J.R., "Numerical Investigation of the Electromigration Boundary Value Problem", Journal of Applied Physics 71(4), 15 February 1992, pp. 1729-1731
Analysis Type(s): Transient Analysis (ANTYPE = 4)
Element Type(s):
2D 8-Node Diffusion Elements (PLANE238)
2D 8-Node Coupled-Field Elements (PLANE223)
Input Listing: vm220.dat

Test Case

Diffusion and mass transport effects due to electromigration are considered in a rectangular conductor of length L and height H. A concentration load of C0 is applied at one end of the plate (x = -L) and a zero diffusion flux boudary condition (blocking diffusion barrier) is applied at the other end (x = 0) of the plate. A transient analysis is performed to determine the concentration evolution at the blocking diffusion end of the plate.

Figure 359: Problem Sketch

Problem Sketch

Material PropertiesGeometric PropertiesLoading
Pure Diffusion Element (PLANE238)

Diffusivity coefficient = 1 m2/s

(MP,DXX)

Coupled Electric-Diffusion Element (PLANE223)
Diffusivity coefficient = 1 m2/s
(MP,DXX)
Electrical resistivity = 1 x 10-7 Ohm-m
(MP,RSVX)
Effective charge/Boltzmann constant = 1.16045 x 104 C-K/J
(TB,MIGR)
Length, L = 2 m
Height, H = 0.2 m
PLANE238
Concentration at x = -L, C0 = 1
Transport velocity, D*ALPHA = 1 m/s
(BF,,VELO)
PLANE223
Concentration at x = -L, C0 = 1
Voltage load, V0 = 0.8152 x 10-1 V
Temperature = 200 °C
(BF,,TEMP)
Offset temperature = 273 °C
(TOFFST)

Analysis Assumptions and Modeling Notes

Two approaches are used to solve this boundary value problem. The first solution uses a diffusion element type (PLANE238) and applies the electromigration driving force ALPHA as transport velocity body load (BF, VELO). The second approach uses a coupled electric-diffusion element type (PLANE223 with KEYOPT(1) = 100100) in conjunction with a Migration Model (TB,MIGR). The Migration Model is used to define the effective electric charge Z*e, which determines the direction and magnitude of the electron-atom momentum exchange responsible for the mass transport of atoms due to the electric current. The voltage DOFs are constrained at location x = 0 and a voltage load of V0 is applied at node 1 in order to achieve the desired electromigration driving force ALPHA.

Transient diffusion and electric-diffusion analyses with stepped loading (KCB,1) are performed with an end time = 50 seconds and a time increment of 0.05 seconds to determine the concentration at the blocking boundary x = 0 for all time points. Initial concentration C0 = 1 is imposed using the IC command. The obtained results are then compared against the reference solution (Figure 1, C (-L, t) = C0, alpha*L = 2).

Results Comparison

The calculated concentration is compared to the target results at the blocking boundary (x = 0) for several normalized time points.

Normalized TimeTargetMechanical APDLRatio
Concentration values using PLANE238 elements
0.011.111.251.13
12.702.711.00
106.696.891.03
39.57.357.390.99
Concentration values using PLANE223 elements
0.011.111.171.05
12.702.690.99
106.696.891.03
39.57.357.390.99

The calculated concentration at the blocking barrier (x = 0) as a function of normalized time is shown in the following figures for PLANE238 and PLANE223 elements respectively.

Figure 360: Concentration vs. Normalized Time using PLANE238 Elements

Concentration vs. Normalized Time using PLANE238 Elements

Figure 361: Nodal Concentration Plot at Time = 50 seconds using PLANE238 Elements

Nodal Concentration Plot at Time = 50 seconds using PLANE238 Elements

Figure 362: Concentration vs. Normalized Time using PLANE223 Elements

Concentration vs. Normalized Time using PLANE223 Elements

Figure 363: Nodal Concentration Plot at Time = 50 seconds using PLANE223 Elements

Nodal Concentration Plot at Time = 50 seconds using PLANE223 Elements