As indicated in the previous topic, a distinction is made between variance-based (C_p) and variance location-based (C_pk) values.

The Statistics menu option Process > Quality capability Cpk computes the C_pk values for all selected field quantities and a user-specified threshold value. For each selected quantity, a single result object is created. Each result object is a field vector that contains the C_pk value at each mesh position.

The input and error information for calculating C_pk is the same as that given in the previous topic for C_p.

For C_pk (scattering- and location-oriented QCS):

with estimated mean μ(Yk).