Breakthrough Values

In the Breakthrough Values dialog box, you can enter parameters related to the device breakthrough or breakdown performance. The data needed to characterize breakthrough values is missing in most datasheets. In such cases, we recommend disabling this feature. In order to ignore the breakdown of the device, select the Disable Breakthrough Model check box. This sets the parameters to very high values, thus preventing the model from simulating the breakthrough effects of the device.

To simulate the breakthrough effects, enter the parameters listed in the following table.

Breakthrough collector-emitter voltage (V)	This value should be greater than the maximum collector-emitter voltage (V), that is, V_{ce br} > V_{ce max}. A good rule of thumb is to use twice the value for V_ce max. In order to determine this value, see the Safe Operating Area diagram provided for the device. See Point A on the sample diagram below.
Breakthrough collector current (A)	This value should be greater than the maximum collector current, that is, I_c br > I_{c max}. A good rule of thumb is to use twice the value for I_{c max}. In order to determine this value, see the Safe Operating Area diagram provided for the device. See Point B on the sample diagram below.
Breakthrough junction temperature (^oC)	This value should be greater than the maximum junction temperature, that is, T_j br > T_{j max}. The operating range for the Junction Temperature is generally specified in the Absolute Maximum Ratings section of the datasheet.
Breakthrough gate-emitter voltage (V)	This value should be set greater than the value for V_ge (On) specified in the Nominal Working Point dialog box.
Collector-emitter resistance after fault (Ohm)	This value represents the collector-emitter resistance of the device after a fault has occurred. Use the default value unless the device vendor can supply a specific value.
Gate-emitter resistance after fault (Ohm)	This value represents the gate-emitter resistance of the device after a fault has occurred. Use the default value unless the device vendor can supply a specific value.

When finished, click Next to continue characterizing the device (Half-Bridge Test Circuit).