If a failure rate catalog is used, the tool implements the fomulas stated in the corresponding published handbooks. In certain cases, details on prediction parameters, formulas, statements, or table entries are subject to interpretation by the reader. The following list of implementation decisions have been made:
IEC 61709, section 6:
The technologies MOS, CMOS, BICMOS for digital ICs are considered all voltage dependent and equation (9) is applied. Section 6.2.1 is unclear about BICMOS and MOS, so they are treated as "digital CMOS" and the pi_U factor has been incorporated (i.e. for table 5, table 6, and table 7).
Similarly for analog ICs, BIFET is considered to be treated as "bipolar analog IC" and formula (9) is applied as well.
IEC 61709, all sections:
In case precomputed lookup tables provide lower bounds, the general formulas are applied except if stated otherwise. For example, table 56 could be interpreted as defining a lower bound for pi_T for temperatures below 40 degrees C which, however, contradicts the statement that formulas (5) and (6) are applied.
SN 29500-2, section 4.1:
The indicated lower bound for tables 7 and 8 (for U < 3V) are not considered in the formula for pi_U, since the general formulas do not include such a restriction.
IEC 62380, section 7.3:
Sinc the indices for delta T have a different range than the internal working cycle, the formula "delta T" for on/off phases is realized by taking the average ambient temperature as indicated by the calculation example.
FIDES Guide 2009, section Ceramic Capacitors:
The CV product is calculated using the rated[2] voltage: CV = V_rated * C. Note that this formula was corrected in tool version 2021 R2. In previous versions the tool used V_applied for CV. In some corner cases this can be of significance, e.g. if your CV product is at the border of low/medium/high classifications. If your project uses FIDES, make sure you correct all ceramic capacitors using the latest handbook.