SPISim VPro Measurements
Measurements
From the main ribbon, select Measure to view the available calculations.
Edges
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Count Crossings- detect selected rise or fall (or both) crossings.
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Range count crossings- detect rise or fall crossings in a selected range.
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Xing slopes- calculate rise or fall slopes at crossings.
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Range xing slopes- calculate crossing slops in selected range.
Peak
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Max peak- identify the maximum peak.
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Min peak- identify the minimum peak.
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Range max peak- identify the maximum peak within a given range.
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Range min peak- identify the minimum peak within a given range.
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Max N peaks- identify N number of maximum peaks.
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Min N peaks- identify N number of minimum peaks.
Peak to Peak
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Max peak to peak - mark peak to peak value.
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Range peak to peak - mark peak to peak in a selected range.
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Moving window peak to peak - report sliding window based peak to peak.
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Moving rage peak to peak - select range to do sliding window peak to peak.
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Max peak to min valley - peak to peak based with slope consideration.
Valley
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Max valley - identify max valley.
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Min valley - identify min valley.
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Range max valley - identify max valley within a selected range.
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Range min valley - identify min valley within a selected range.
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Max N valleys - identify N number of max valleys.
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Min N valleys - identify N number of min valleys.
Average
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Average - report average value of selected traces.
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Range average - report average value in selected range.
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Root-mean-square - report RMS value of selected traces.
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Range root-mean-square - report RMS value of traces in a selected range.
Batch Measure
Launches the Batch Measurement and Report window. Provides batch measurements for waveform traces and reports as a csv file.
This function works in two modes:
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Measure all traces within one waveform file, or
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Measure common probes across different waveform file.
Add one or more measurements at specified time point/ranges with "," as the delimiter.
Select cells and apply with same value using the Set Cells button.
Remove unwanted measurements using "-" button.
Settings may be exported for later use.